High Precision gauge ideal for applications with minimum access orcontact areas. Enhanced graphic scope Displays A Scan & B Scan fora cross section view
Resolution: 0.0001" (0.001 mm)
The Checkline TI-PVX Precision Ultrasonic A-scan Thickness gauge provides the flexibility necessary for both high resolution and penetration requirements.
The Checkline TI-PVX Precision Ultrasonic A-scan Thickness gauge's ability to use a variety of single element transducers for specific applications: Standard Delay Line (acrylic and graphite tips for metals and thin plastics), Pencil Delay Line (tough access area on thin materials), and Contact transducers (variety of applications) makes it the perfect flexibel tool for very precise and delicate measurements. The adjustable resolution settings add to the PVXs flexibilty.
The selectable viewing options provide the user with additional flexibility during operation: (RF waveform, +/- Rectified waveform, and Large Digits with Scan Bar.
The time based B-Scan feature displays a cross section of the test material. Displays the profile of the opposite surface of the material.
The high speed scan feature speeds up the inspection process by making 32 measurements per second. Remove transducer from the test material and display the minimum measurement scanned.
12,000 readings and waveforms (alphanumeric storage).
1/8 in. VGAgrayscale display
16 factory and 48 user-definedsetups.
A-Scan Rectified +/- (half wave view) RF (full waveform view) B-Scan Time based cross sectionview. Display speed of 15 secs per screen. Large Digits Standard thicknessview. Digit Height: 0.400 in (10mm). Scan Bar 6 readings per second.Viewable in B-Scan and Large Digit views. Repeatability Bar Graph Bar graphindicates stability of reading.
Three 1.5V alkaline or 1.2V NiCad AAcells
Typically operatesfor 150 hours on alkaline and 100 hours on NiCad
Auto power off if idle 5 min.
-14 to140F (-10 to 60C).
2.5 W x 6.5 H x 1.24 D inches (63.5W x 165 H x 31.5 D mm).
The F-000-7000 V-Block Probe Holder Pencil Probe transducer holder provides enhanced control when measuring small circular items and other curved surfaces. It can also be used on flat surfaces for better repeatability and quick perpendicular placing of the probe to achieve quick and easy repeatable measuring results